QUALITY ASSURANCE
QUALITY ASSURANCE
| CSD Quality Management System
CSD Quality Management System
Boriton has a complete set of incoming material inspection process (three-level inspection system). It cooperates with third-party authoritative inspection centers such as China Electric Power, White Horse and Core Mining to strictly control the quality inspection process and ensure that the quality of incoming materials is free of problems. Three-level detection system The first level is packaging and label detection The second level is the body appearance inspection Level III is X-Ray, cover opening, electrical performance testing Test standard
Test standard
● IPC/JEDEC Solid State Technology Association Standards ● GB/T2828.1-2012 National Sampling Standard ● IDEA-STD-1010-B Quality Inspection Standard for Electronic Components of Independent Distributor Alliance ● MIL-STD-883 Experimental methods and procedures for microelectronic devices ● ISO9001 standard ● Customer requirements ● Specifications ● Gold sample library |
Detectable items
Detectable items
Project | External visual inspection | QC laboratory test | Third-party laboratory testing |
Supplier category | Original factory/authorized agent | EMS/OEM/domestic and foreign terminals | Materials with detection requirements at the client/business end |
Detectable items | Visual inspection of appearance to ensure that the model, package, packaging, production batch, humidity sensitivity grade, oxidation, etc. meet the requirements | Real and fake goods test, label and packaging test, body appearance and electrical performance test, X-ray nondestructive test, cover opening test, weldability test | Reliability test, key function test, chemical opening test, DC characteristic parameter test, ultrasonic scanning test, etc |
Detection equipment | Microscope, magnifying glass | 4K high-definition microscope, X-ray tester, metallographic microscope, physical capping machine, semiconductor characteristic plotter, LCR test bridge, multimeter, signal generator, etc | Laser capping machine, ultrasonic scanner, signal generator, semiconductor tester and other professional laboratory equipment |
Refer to the test process | Specifications, customer requirements, GB/T2828.1-2012 national sampling standards | Gold sample library, GB/T2828.1-2012 national sampling standard, IDEA-STD-1010-B quality inspection standard for electronic components of independent distributor alliance, MIL-STD-883 experimental methods and procedures of microelectronic devices, specifications, etc | International general testing standards and industry standards for electronic components |
